One coordinated workflow
Electrical measurements, fast transients, optical characterization, temperature control and external instruments can be operated as parts of the same experiment.
WHY ARKEO MATTERS
More than a collection of instruments.
Advanced characterization often requires different electrical, optical and environmental tools. ARKEO makes them work as one coordinated platform, reducing the separation between measurement setup, experiment control and data analysis.
A system that can evolve
The Eurocard acquisition architecture allows measurement and control modules to be added, replaced or reconfigured as new research needs emerge.
Controlled and repeatable conditions
The measurement stage combines stable electrical contacting, Kelvin sensing, optical access and active temperature control around the device under test.
Data ready for analysis
Every routine stores settings, parameters and tab-delimited results in a consistent structure organized by user, date, device and test.
MODULAR ARCHITECTURE
Built from the channel to the sample.
The ARKEO acquisition unit is based on rack-mounted Eurocard modules connected to a shared backplane. The measurement stage and accessories are then configured around the devices and techniques required by the laboratory.
Acquisition and control
The rack-based core manages signal acquisition, hardware control and synchronization. Measurement boards share power and communication through the ARKEO backplane.
Measurement channels
The channel architecture is selected around the required precision, current and voltage ranges, acquisition speed and number of devices measured simultaneously.
Stage and sample interface
Movable probes, shielded connections, interchangeable masks, optical access and temperature control adapt the platform to different device geometries and routines.
Accessories and integrations
Light sources, spectrometers, monochromators, environmental chambers, sensors and programmable third-party instruments become coordinated elements of the system.
MEASUREMENT CAPABILITIES
From device performance to physical understanding.
The available routines depend on the installed measurement modules and accessories. A platform can be configured for essential characterization or for a broader set of complementary techniques.
01ELECTRICAL PERFORMANCE
Measure operation and losses
Characterize device performance under illumination and in the dark, follow its operating point and investigate resistive behaviour.
- Illuminated and dark JV
- MPPT and fixed operating points
- Two- and four-wire resistivity
02TRANSIENT & FREQUENCY
Investigate charge dynamics
Combine fast excitation, synchronized acquisition and frequency sweeps to study transport, extraction and recombination processes.
- TPV and TPC
- Photo-CELIV and Dark-CELIV
- EIS, IMPS and IMVS
03OPTICAL & SPECTRAL
Connect light and electrical response
Integrate controlled illumination and detection hardware for wavelength-dependent and luminescence-based characterization.
- IPCE / EQE
- Photoluminescence and electroluminescence
- PLQY and pulsed optical routines
04STABILITY & RELIABILITY
Observe devices over time
Run repeatable sequences under controlled illumination and environmental conditions, from periodic characterization to long-duration tracking.
- Periodic JV during tracking
- Day-night cycling
- Environmental and temperature sequences
GLOVE BOX INTEGRATION
Bring ARKEO inside the controlled atmosphere.
ARKEO can be configured for glove box installation with internal stage access, integrated illumination and dedicated feedthrough solutions for cables, fibers, gases, liquids and custom interfaces.
Internal stageDirect access to the sample and probes
Integrated lightTop illumination and compact hardware mounting
Custom feedthroughsSignals, optics, cooling and utilities
ExpandableInterfaces matched to the experiment layout
ARKEO FEEDTHROUGHSSignals and utilities through controlled environments.
Explore feedthroughs Explore fittings for cables, coaxial lines, tubing and custom interfaces.
CONFIGURABLE CHANNEL ARCHITECTURE
One platform, from a focused setup to parallel measurement.
The number and type of channels are defined by the experiment. ARKEO can prioritize advanced characterization on a single device or expand to many independent channels for simultaneous measurements and long-term stability studies.
SINGLE-CHANNEL CONFIGURATION
Maximum measurement depth
A focused ARKEO can combine a high-precision source-measure channel with fast generation and acquisition, optical accessories and the temperature-controlled stage. It is suited to advanced characterization of one device or experiment at a time.
- Precision steady-state electrical measurements
- Fast transient and frequency-domain routines
- Optical, spectral and luminescence integrations
- Flexible stage and temperature-dependent testing
MULTICHANNEL CONFIGURATION
Independent parallel testing
ARKEO can be expanded with multiple independent source-measure channels for simultaneous device characterization. The software coordinates each channel separately while sharing the same platform, accessories and data architecture.
- Parallel JV, MPPT and fixed-setpoint operation
- Independent devices, users and channel settings
- Periodic characterization during long-term tests
- Sample holders, light soakers and environmental chambers
4 channelsper SMU board
≈ 18 mAstandard low-current range
≈ 250 mAstandard high-current range
±10 Vper SMU · 20 V differential option
Same modular foundation
The acquisition rack, backplane, software philosophy and integration approach remain consistent. The channel count, installed modules, sample interface and accessories are selected for the intended workflow.
Expandable over time
Available rack space and plug-in modules allow capabilities or channel capacity to be extended without replacing the complete platform.
SOFTWARE AND DATA
One environment for the complete experiment.
ARKEO coordinates channels, temperature, illumination, sensors and external instruments. Every result is stored with its settings and metadata for analysis, comparison and long-term archiving.
Centralized control
Operate routines, installed modules and external instruments from one software environment.
Automated sequences
Combine repeated measurements, temperature ramps and synchronized actions into reproducible workflows.
Independent channels
Run each device with its own user, settings and measurement state.
Open integration
Connect programmable instruments through SCPI, serial, TCP/IP, REST, SDKs or custom drivers.
FAIR DATA / NOMAD
From ARKEO measurements to structured, searchable research data.
ARKEO integrates with NOMAD through a dedicated CICCI Research plugin. Laboratories using NOMAD Oasis can keep the normal ARKEO workflow: supported measurement files are uploaded to NOMAD and automatically transformed into structured entries that are easier to search, compare, share and reuse. Experiment orchestration is a separate, optional layer.
NOMAD OASISDesigned for local and institutional research-data workflows.Private data remain under the laboratory's normal NOMAD permissions.
The laboratory keeps the original TXT measurement outputs generated by ARKEO.
The plugin recognizes the ARKEO structure and extracts experiment metadata and results.
Device, irradiance, JV settings, stability data and other quantities become searchable.
Data can stay private in NOMAD Oasis and be shared or published when the research team decides.
CONFIGURE YOUR ARKEO
The instrument follows the experiment.
Each system is defined from the laboratory's devices, required measurements and workflow. This determines the channel architecture, modules, stage, accessories and software integrations included in the final platform.
Define the devices
Device type, geometry, active area, expected voltage and current, sample quantity and contacting requirements.
Choose the measurements
Required routines, precision, acquisition speed, spectral range, optical access and temperature or environmental conditions.
Select the channels
One focused channel or multiple independent channels, with the appropriate electrical ranges and measurement hardware.
Integrate the laboratory
Existing instruments, custom sample interfaces, accessories, automated sequences and future expansion requirements.
YOUR MEASUREMENT PLATFORM
Tell us what you need to understand.
Share your devices, routines, expected ranges, sample quantity and environmental conditions. We will define the suitable ARKEO channel architecture, modules and accessories with you.